2006 | ||
---|---|---|
3 | EE | R. Raghuraman, Sridhar Iyer: Capacity-Constrained Design of Resilient Multi-Tier Wireless Mesh Networks. INFOCOM 2006 |
2004 | ||
2 | EE | R. Raghuraman: Simulation Requirements for Vectors in ATE Formats. ITC 2004: 1100-1107 |
2002 | ||
1 | EE | Jayashree Saxena, Kenneth M. Butler, John Gatt, R. Raghuraman, Sudheendra Phani Kumar, Supatra Basu, David J. Campbell, John Berech: Scan-Based Transition Fault Testing - Implementation and Low Cost Test Challenges . ITC 2002: 1120-1129 |
1 | Supatra Basu | [1] |
2 | John Berech | [1] |
3 | Kenneth M. Butler | [1] |
4 | David J. Campbell | [1] |
5 | John Gatt | [1] |
6 | Sridhar Iyer | [3] |
7 | Sudheendra Phani Kumar | [1] |
8 | Jayashree Saxena | [1] |