| |
| 2004 | ||
|---|---|---|
| 2 | EE | Kenneth M. Butler, Jayashree Saxena, Tony Fryars, Graham Hetherington: Minimizing Power Consumption in Scan Testing: Pattern Generation and DFT Techniques. ITC 2004: 355-364 |
| 1999 | ||
| 1 | Graham Hetherington, Tony Fryars, Nagesh Tamarapalli, Mark Kassab, Abu S. M. Hassan, Janusz Rajski: Logic BIST for large industrial designs: real issues and case studies. ITC 1999: 358-367 | |
| 1 | Kenneth M. Butler | [2] |
| 2 | Abu S. M. Hassan | [1] |
| 3 | Graham Hetherington | [1] [2] |
| 4 | Mark Kassab | [1] |
| 5 | Janusz Rajski | [1] |
| 6 | Jayashree Saxena | [2] |
| 7 | Nagesh Tamarapalli | [1] |