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Sudheendra Phani Kumar

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2002
1EEJayashree Saxena, Kenneth M. Butler, John Gatt, R. Raghuraman, Sudheendra Phani Kumar, Supatra Basu, David J. Campbell, John Berech: Scan-Based Transition Fault Testing - Implementation and Low Cost Test Challenges . ITC 2002: 1120-1129

Coauthor Index

1Supatra Basu [1]
2John Berech [1]
3Kenneth M. Butler [1]
4David J. Campbell [1]
5John Gatt [1]
6R. Raghuraman [1]
7Jayashree Saxena [1]

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