Serge Bernard

2008
23		Fabien Soulier, Lionel Gouyet, Guy Cathébras, Serge Bernard, David Guiraud, Yves Bertrand: Considerations on Improving the Design of CUFF Electrode for ENG Recording - Geometrical Approach, Dedicated IC, Sensitivity, Noise Rejection. BIODEVICES (2) 2008: 180-185
22	EE	Fabien Soulier, Jean-Baptiste Lerat, Lionel Gouyet, Serge Bernard, Guy Cathébras: A Neural Stimulator Output Stage for Dodecapolar Electrodes. ISVLSI 2008: 487-490
2007
21	EE	Philippe Cauvet, Serge Bernard, Michel Renovell: System-in-Package, a Combination of Challenges and Solutions. European Test Symposium 2007: 193-199
20	EE	Vincent Kerzerho, Philippe Cauvet, Serge Bernard, Florence Azaïs, Mariane Comte, Michel Renovell: "Analogue Network of Converters": A DFT Technique to Test a Complete Set of ADCs and DACs Embedded in a Complex SiP or SOC. European Test Symposium 2007: 211-216
2006
19	EE	Vincent Kerzerho, Philippe Cauvet, Serge Bernard, Florence Azaïs, Mariane Comte, Michel Renovell: "Analogue Network of Converters": A DFT Technique to Test a Complete Set of ADCs and DACs Embedded in a Complex SiP or SOC. European Test Symposium 2006: 159-164
18	EE	V. Fresnaud, Lilian Bossuet, Dominique Dallet, Serge Bernard, J. M. Janik, B. Agnus, Philippe Cauvet, Ph. Gandy: A Low Cost Alternative Method for Harmonics Estimation in a BIST Context. European Test Symposium 2006: 193-198
17	EE	Vincent Kerzerho, Philippe Cauvet, Serge Bernard, Florence Azaïs, Mariane Comte, Michel Renovell: A Novel DFT Technique for Testing Complete Sets of ADCs and DACs in Complex SiPs. IEEE Design & Test of Computers 23(3): 234-243 (2006)
16	EE	Vincent Kerzerho, Serge Bernard, Philippe Cauvet, J. M. Janik: A First Step for an INL Spectral-Based BIST: The Memory Optimization. J. Electronic Testing 22(4-6): 351-357 (2006)
2005
15	EE	Florence Azaïs, Serge Bernard, Yves Bertrand, Mariane Comte, Michel Renovell: Efficiency of Optimized Dynamic Test Flows for ADCs: Sensitivity to Specifications. J. Electronic Testing 21(3): 291-298 (2005)
2004
14	EE	Serge Bernard, Mariane Comte, Florence Azaïs, Yves Bertrand, Michel Renovell: Efficiency of Spectral-Based ADC Test Flows to Detect Static Errors. J. Electronic Testing 20(3): 257-267 (2004)
13	EE	Florence Azaïs, Serge Bernard, Yves Bertrand, Mariane Comte, Michel Renovell: Correlation Between Static and Dynamic Parameters of A-to-D Converters: In the View of a Unique Test Procedure. J. Electronic Testing 20(4): 375-387 (2004)
2003
12	EE	Serge Bernard, Mariane Comte, Florence Azaïs, Yves Bertrand, Michel Renovell: A New Methodology For ADC Test Flow Optimization. ITC 2003: 201-209
11	EE	Serge Bernard, Florence Azaïs, Yves Bertrand, Michel Renovell: On-Chip Generation of Ramp and Triangle-Wave Stimuli for ADC BIST. J. Electronic Testing 19(4): 469-479 (2003)
10	EE	Florence Azaïs, Serge Bernard, Yves Bertrand, Mariane Comte, Michel Renovell: A-to-D converters static error detection from dynamic parameter measurement. Microelectronics Journal 34(10): 945-953 (2003)
2002
9	EE	Yves Bertrand, Marie-Lise Flottes, Florence Azaïs, Serge Bernard, Laurent Latorre, Regis Lorival: European Network for Test Education. DELTA 2002: 230-234
2001
8	EE	Florence Azaïs, Serge Bernard, Yves Bertrand, Michel Renovell: Implementation of a linear histogram BIST for ADCs. DATE 2001: 590-595
7	EE	Serge Bernard, Florence Azaïs, Yves Bertrand, Michel Renovell: Analog BIST Generator for ADC Testing. DFT 2001: 338-346
6		Michel Renovell, Jean Marc Gallière, Florence Azaïs, Serge Bernard, Yves Bertrand: Boolean and current detection of MOS transistor with gate oxide short. ITC 2001: 1039-1048
5		Florence Azaïs, Serge Bernard, Yves Bertrand, Michel Renovell: On-chip Generator of a Saw-Tooth Test Stimulus for ADC BIST. VLSI-SOC 2001: 425-436
4	EE	Florence Azaïs, Serge Bernard, Yves Bertrand, Xavier Michel, Michel Renovell: A Low-Cost Adaptive Ramp Generator for Analog BIST Applications. VTS 2001: 266-271
3	EE	Florence Azaïs, Serge Bernard, Yves Bertrand, Michel Renovell: A Low-Cost BIST Architecture for Linear Histogram Testing of ADCs. J. Electronic Testing 17(2): 139-147 (2001)
2	EE	Florence Azaïs, Serge Bernard, Yves Bertrand, Michel Renovell: Optimizing Sinusoidal Histogram Test for Low Cost ADC BIST. J. Electronic Testing 17(3-4): 255-266 (2001)
2000
1	EE	Michel Renovell, Florence Azaïs, Serge Bernard, Yves Bertrand: Hardware Resource Minimization for Histogram-Based ADC BIST. VTS 2000: 247-254

Coauthor Index

1	B. Agnus	[18]
2	Florence Azaïs	[1] [2] [3] [4] [5] [6] [7] [8] [9] [10] [11] [12] [13] [14] [15] [17] [19] [20]
3	Yves Bertrand	[1] [2] [3] [4] [5] [6] [7] [8] [9] [10] [11] [12] [13] [14] [15] [23]
4	Lilian Bossuet	[18]
5	Guy Cathébras	[22] [23]
6	Philippe Cauvet	[16] [17] [18] [19] [20] [21]
7	Mariane Comte	[10] [12] [13] [14] [15] [17] [19] [20]
8	Dominique Dallet	[18]
9	Marie-Lise Flottes	[9]
10	V. Fresnaud	[18]
11	Jean Marc Gallière	[6]
12	Ph. Gandy	[18]
13	Lionel Gouyet	[22] [23]
14	David Guiraud	[23]
15	J. M. Janik	[16] [18]
16	Vincent Kerzerho	[16] [17] [19] [20]
17	Laurent Latorre	[9]
18	Jean-Baptiste Lerat	[22]
19	Regis Lorival	[9]
20	Xavier Michel	[4]
21	Michel Renovell	[1] [2] [3] [4] [5] [6] [7] [8] [10] [11] [12] [13] [14] [15] [17] [19] [20] [21]
22	Fabien Soulier	[22] [23]