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J-C. Bodin

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2000
3EEMichel Renovell, Florence Azaïs, J-C. Bodin, Yves Bertrand: Combining Functional and Structural Approaches for Switched-Current Circuit Testing. J. Electronic Testing 16(3): 259-267 (2000)
1998
2EEMichel Renovell, Florence Azaïs, J-C. Bodin, Yves Bertrand: BISTing Switched-Current Circuits. Asian Test Symposium 1998: 372-377
1EEFlorence Azaïs, Michel Renovell, Yves Bertrand, J-C. Bodin: Design-For-Testability for Switched-Current Circuits. VTS 1998: 370-375

Coauthor Index

1Florence Azaïs [1] [2] [3]
2Yves Bertrand [1] [2] [3]
3Michel Renovell [1] [2] [3]

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)