![]() | ![]() |
2000 | ||
---|---|---|
3 | EE | Michel Renovell, Florence Azaïs, J-C. Bodin, Yves Bertrand: Combining Functional and Structural Approaches for Switched-Current Circuit Testing. J. Electronic Testing 16(3): 259-267 (2000) |
1998 | ||
2 | EE | Michel Renovell, Florence Azaïs, J-C. Bodin, Yves Bertrand: BISTing Switched-Current Circuits. Asian Test Symposium 1998: 372-377 |
1 | EE | Florence Azaïs, Michel Renovell, Yves Bertrand, J-C. Bodin: Design-For-Testability for Switched-Current Circuits. VTS 1998: 370-375 |
1 | Florence Azaïs | [1] [2] [3] |
2 | Yves Bertrand | [1] [2] [3] |
3 | Michel Renovell | [1] [2] [3] |