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| 2006 | ||
|---|---|---|
| 1 | EE | Christophe Entringer, Philippe Flatresse, Philippe Galy, Florence Azaïs, Pascal Nouet: Electro-thermal short pulsed simulation for SOI technology. Microelectronics Reliability 46(9-11): 1482-1485 (2006) |
| 1 | Florence Azaïs | [1] |
| 2 | Philippe Flatresse | [1] |
| 3 | Philippe Galy | [1] |
| 4 | Pascal Nouet | [1] |