| 2007 |
|---|
| 8 | EE | Tiago R. Balen,
Fernanda Lima Kastensmidt,
Marcelo Lubaszewski,
Michel Renovell:
Single Event Upset in SRAM-based Field Programmable Analog Arrays: Effects and Mitigation.
ISVLSI 2007: 192-197 |
| 7 | EE | Tiago R. Balen,
José Vicente Calvano,
Marcelo Lubaszewski,
Michel Renovell:
Built-In Self-Test of Field Programmable Analog Arrays based on Transient Response Analysis.
J. Electronic Testing 23(6): 497-512 (2007) |
| 2006 |
|---|
| 6 | EE | Tiago R. Balen,
José Vicente Calvano,
Marcelo Lubaszewski,
Michel Renovell:
Functional Test of Field Programmable Analog Arrays.
VTS 2006: 326-333 |
| 2005 |
|---|
| 5 | EE | Gustavo Pereira,
Antonio Andrade Jr.,
Tiago R. Balen,
Marcelo Lubaszewski,
Florence Azaïs,
Michel Renovell:
Testing the Interconnect Networks and I/O Resources of Field Programmable Analog Arrays.
VTS 2005: 389-394 |
| 4 | EE | Tiago R. Balen,
Antonio Q. Andrade,
Florence Azaïs,
Marcelo Lubaszewski,
Michel Renovell:
Applying the Oscillation Test Strategy to FPAA's Configurable Analog Blocks.
J. Electronic Testing 21(2): 135-146 (2005) |
| 3 | EE | Antonio Andrade Jr.,
Gustavo Vieira,
Tiago R. Balen,
Marcelo Lubaszewski,
Florence Azaïs,
Michel Renovell:
Built-in self-test of global interconnects of field programmable analog arrays.
Microelectronics Journal 36(12): 1112-1123 (2005) |
| 2004 |
|---|
| 2 | EE | Tiago R. Balen,
Antonio Andrade Jr.,
Florence Azaïs,
Michel Renovell,
Marcelo Lubaszewski:
Testing the Configurable Analog Blocks of Field Programmable Analog Arrays.
ITC 2004: 893-902 |
| 1 | EE | Tiago R. Balen,
Antonio Andrade Jr.,
Florence Azaïs,
Marcelo Lubaszewski,
Michel Renovell:
An Approach to the Built-In Self-Test of Field Programmable Analog Arrays.
VTS 2004: 383-388 |
