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2006 | ||
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1 | EE | Christophe Entringer, Philippe Flatresse, Philippe Galy, Florence Azaïs, Pascal Nouet: Electro-thermal short pulsed simulation for SOI technology. Microelectronics Reliability 46(9-11): 1482-1485 (2006) |
1 | Florence Azaïs | [1] |
2 | Christophe Entringer | [1] |
3 | Philippe Flatresse | [1] |
4 | Pascal Nouet | [1] |