| 2008 |
|---|
| 7 | EE | Yves Joannon,
Vincent Beroulle,
Chantal Robach,
Smail Tedjini,
Jean-Louis Carbonéro:
Decreasing Test Qualification Time in AMS and RF Systems.
IEEE Design & Test of Computers 25(1): 29-37 (2008) |
| 2007 |
|---|
| 6 | EE | Jeanne Tongbong,
Salvador Mir,
Jean-Louis Carbonéro:
Interactive presentation: Evaluation of test measures for LNA production testing using a multinormal statistical model.
DATE 2007: 731-736 |
| 5 | EE | Yves Joannon,
Vincent Beroulle,
Chantal Robach,
Smail Tedjini,
Jean-Louis Carbonéro:
Qualification of behavioral level design validation for AMS & RF SoCs.
VLSI-SoC 2007: 206-211 |
| 2006 |
|---|
| 4 | | Yves Joannon,
Vincent Beroulle,
Rami Khouri,
Chantal Robach,
Smail Tedjini,
Jean-Louis Carbonéro:
Behavioral Modeling of WCDMA Transceiver with VHDL-AMS Language.
DDECS 2006: 113-118 |
| 3 | EE | Luís Rolíndez,
Salvador Mir,
Ahcène Bounceur,
Jean-Louis Carbonéro:
A SNDR BIST for Sigma-Delta Analogue-to-Digital Converters.
VTS 2006: 314-319 |
| 2 | EE | Luís Rolíndez,
Salvador Mir,
Ahcène Bounceur,
Jean-Louis Carbonéro:
A BIST Scheme for SNDR Testing of SigmaDelta ADCs Using Sine-Wave Fitting.
J. Electronic Testing 22(4-6): 325-335 (2006) |
| 2005 |
|---|
| 1 | EE | Rabeb Kheriji,
V. Danelon,
Jean-Louis Carbonéro,
Salvador Mir:
Optimising Test Sets for a Low Noise Amplifier with a Defect-Oriented Approach.
DATE 2005: 170-171 |
