| 2009 |
|---|
| 9 | EE | Haralampos-G. D. Stratigopoulos,
Salvador Mir,
Ahcène Bounceur:
Evaluation of Analog/RF Test Measurements at the Design Stage.
IEEE Trans. on CAD of Integrated Circuits and Systems 28(4): 582-590 (2009) |
| 2007 |
|---|
| 8 | EE | Ahcène Bounceur,
Salvador Mir,
Emmanuel Simeu,
Luís Rolíndez:
Estimation of Test Metrics for the Optimisation of Analogue Circuit Testing.
J. Electronic Testing 23(6): 471-484 (2007) |
| 2006 |
|---|
| 7 | EE | Achraf Dhayni,
Salvador Mir,
Libor Rufer,
Ahcène Bounceur:
Pseudorandom functional BIST for linear and nonlinear MEMS.
DATE 2006: 664-669 |
| 6 | EE | Ahcène Bounceur,
Salvador Mir,
Luís Rolíndez,
Emmanuel Simeu:
CAT platform for analogue and mixed-signal test evaluation and optimization.
VLSI-SoC 2006: 320-325 |
| 5 | EE | Livier Lizzarraga,
Salvador Mir,
Gilles Sicard,
Ahcène Bounceur:
Study of a BIST Technique for CMOS Active Pixel Sensors.
VLSI-SoC 2006: 326-331 |
| 4 | EE | Luís Rolíndez,
Salvador Mir,
Ahcène Bounceur,
Jean-Louis Carbonéro:
A SNDR BIST for Sigma-Delta Analogue-to-Digital Converters.
VTS 2006: 314-319 |
| 3 | EE | Luís Rolíndez,
Salvador Mir,
Ahcène Bounceur,
Jean-Louis Carbonéro:
A BIST Scheme for SNDR Testing of SigmaDelta ADCs Using Sine-Wave Fitting.
J. Electronic Testing 22(4-6): 325-335 (2006) |
| 2005 |
|---|
| 2 | EE | Achraf Dhayni,
Salvador Mir,
Libor Rufer,
Ahcène Bounceur:
On-chip Pseudorandom Testing for Linear and Nonlinear MEMS.
VLSI-SoC 2005: 245-266 |
| 2004 |
|---|
| 1 | EE | Luís Rolíndez,
Salvador Mir,
Guillaume Prenat,
Ahcène Bounceur:
A 0.18 µm CMOS Implementation of On-chip Analogue Test Signal Generation from Digital Test Patterns.
DATE 2004: 706-707 |
