| 2003 |
|---|
| 4 | EE | Jin-Fu Li,
Ruey-Shing Tzeng,
Cheng-Wen Wu:
Testing and Diagnosis Methodologies for Embedded Content Addressable Memories.
J. Electronic Testing 19(2): 207-215 (2003) |
| 2002 |
|---|
| 3 | EE | Jin-Fu Li,
Ruey-Shing Tzeng,
Cheng-Wen Wu:
Testing and Diagnosing Embedded Content Addressable Memories.
VTS 2002: 389-394 |
| 2 | EE | Jin-Fu Li,
Ruey-Shing Tzeng,
Cheng-Wen Wu:
Diagnostic Data Compression Techniques for Embedded Memories with Built-In Self-Test.
J. Electronic Testing 18(4-5): 515-527 (2002) |
| 2001 |
|---|
| 1 | EE | Chih-Wea Wang,
Ruey-Shing Tzeng,
Chi-Feng Wu,
Chih-Tsun Huang,
Cheng-Wen Wu,
Shi-Yu Huang,
Shyh-Horng Lin,
Hsin-Po Wang:
A Built-in Self-Test and Self-Diagnosis Scheme for Heterogeneous SRAM Clusters.
Asian Test Symposium 2001: 103- |
