| 2004 |
|---|
| 3 | EE | Kuo-Liang Cheng,
Jing-Reng Huang,
Chih-Wea Wang,
Chih-Yen Lo,
Li-Ming Denq,
Chih-Tsun Huang,
Shin-Wei Hung,
Jye-Yuan Lee:
An SOC Test Integration Platform and Its Industrial Realization.
ITC 2004: 1213-1222 |
| 2 | EE | Li-Ming Denq,
Rei-Fu Huang,
Cheng-Wen Wu,
Yeong-Jar Chang,
Wen Ching Wu:
A Parallel Built-in Diagnostic Scheme for Multiple Embedded Memories.
MTDT 2004: 65-69 |
| 2003 |
|---|
| 1 | EE | Rei-Fu Huang,
Li-Ming Denq,
Cheng-Wen Wu,
Jin-Fu Li:
A Testability-Driven Optimizer and Wrapper Generator for Embedded Memories.
MTDT 2003: 53- |
