| 2006 |
|---|
| 8 | EE | J. M. Rampnoux,
H. Michel,
M. Amine Salhi,
Stéphane Grauby,
Wilfrid Claeys,
Stefan Dilhaire:
Time gating imaging through thick silicon substrate: a new step towards backside characterisation.
Microelectronics Reliability 46(9-11): 1520-1524 (2006) |
| 2005 |
|---|
| 7 | EE | Stéphane Grauby,
M. Amine Salhi,
Wilfrid Claeys,
D. Trias,
Stefan Dilhaire:
ElectroStatic Discharge Fault Localization by Laser Probing.
Microelectronics Reliability 45(9-11): 1482-1486 (2005) |
| 2004 |
|---|
| 6 | EE | Stefan Dilhaire,
Stéphane Grauby,
S. Jorez,
Wilfrid Claeys:
Strain energy imaging of a power MOS transistor using speckle interferometry.
IEEE Transactions on Reliability 53(2): 293-296 (2004) |
| 5 | EE | Luis David Patiño Lopez,
Stéphane Grauby,
Stefan Dilhaire,
M. Amine Salhi,
Wilfrid Claeys,
Stéphane Lefèvre,
Sebastian Volz:
Characterization of the thermal behavior of PN thermoelectric couples by scanning thermal microscope.
Microelectronics Journal 35(10): 797-803 (2004) |
| 4 | EE | Stefan Dilhaire,
Stéphane Grauby,
Wilfrid Claeys,
Jean-Christophe Batsale:
Thermal parameters identification of micrometric layers of microelectronic devices by thermoreflectance microscopy.
Microelectronics Journal 35(10): 811-816 (2004) |
| 3 | EE | Josep Altet,
J. M. Rampnoux,
Jean-Christophe Batsale,
Stefan Dilhaire,
Antonio Rubio,
Wilfrid Claeys,
Stéphane Grauby:
Applications of temperature phase measurements to IC testing.
Microelectronics Reliability 44(1): 95-103 (2004) |
| 2003 |
|---|
| 2 | EE | Stefan Dilhaire,
M. Amine Salhi,
Stéphane Grauby,
Wilfrid Claeys:
Laser Seebeck Effect Imaging (SEI) and Peltier Effect Imaging (PEI): complementary investigation methods.
Microelectronics Reliability 43(9-11): 1609-1613 (2003) |
| 1 | EE | G. Andriamonje,
V. Pouget,
Y. Ousten,
D. Lewis,
Y. Danto,
J. M. Rampnoux,
Y. Ezzahri,
Stefan Dilhaire,
Stéphane Grauby,
Wilfrid Claeys:
Application of Picosecond Ultrasonics to Non-Destructive Analysis in VLSI circuits.
Microelectronics Reliability 43(9-11): 1803-1807 (2003) |
