R. Ecoffet

2005
2	EE	Raoul Velazco, R. Ecoffet, F. Faure: How to Characterize the Problem of SEU in Processors and Representative Errors Observed on Flight. IOLTS 2005: 303-308
2000
1	EE	V. Pouget, P. Fouillat, D. Lewis, Hervé Lapuyade, L. Sarger, F. M. Roche, S. Duzellier, R. Ecoffet: An Overview of the Applications of a Pulsed Laser System for SEU Testing. IOLTW 2000: 52-

Coauthor Index

1	S. Duzellier	[1]
2	F. Faure	[2]
3	P. Fouillat	[1]
4	Hervé Lapuyade	[1]
5	D. Lewis	[1]
6	V. Pouget	[1]
7	F. M. Roche	[1]
8	L. Sarger	[1]
9	Raoul Velazco	[2]

Colors in the list of coauthors