| |
| 2003 | ||
|---|---|---|
| 1 | EE | G. Andriamonje, V. Pouget, Y. Ousten, D. Lewis, Y. Danto, J. M. Rampnoux, Y. Ezzahri, Stefan Dilhaire, Stéphane Grauby, Wilfrid Claeys: Application of Picosecond Ultrasonics to Non-Destructive Analysis in VLSI circuits. Microelectronics Reliability 43(9-11): 1803-1807 (2003) |
| 1 | Wilfrid Claeys | [1] |
| 2 | Y. Danto | [1] |
| 3 | Stefan Dilhaire | [1] |
| 4 | Y. Ezzahri | [1] |
| 5 | Stéphane Grauby | [1] |
| 6 | D. Lewis | [1] |
| 7 | Y. Ousten | [1] |
| 8 | V. Pouget | [1] |
| 9 | J. M. Rampnoux | [1] |