dblp.uni-trier.dewww.uni-trier.de

Y. Ousten

List of publications from the DBLP Bibliography Server - FAQ
Coauthor Index - Ask others: ACM DL/Guide - CiteSeer - CSB - Google - MSN - Yahoo

2005
7EEH. A. Post, P. Letullier, T. Briolat, R. Humke, R. Schuhmann, K. Saarinen, W. Werner, Y. Ousten, G. Lekens, A. Dehbi: Failure mechanisms and qualification testing of passive components. Microelectronics Reliability 45(9-11): 1626-1632 (2005)
6EEA. Dehbi, Y. Ousten, Y. Danto, W. Wondrak: Vibration lifetime modelling of PCB assemblies using steinberg model. Microelectronics Reliability 45(9-11): 1658-1661 (2005)
2003
5EEG. Andriamonje, V. Pouget, Y. Ousten, D. Lewis, Y. Danto, J. M. Rampnoux, Y. Ezzahri, Stefan Dilhaire, Stéphane Grauby, Wilfrid Claeys: Application of Picosecond Ultrasonics to Non-Destructive Analysis in VLSI circuits. Microelectronics Reliability 43(9-11): 1803-1807 (2003)
2002
4EEA. Dehbi, W. Wondrak, Y. Ousten, Y. Danto: High temperature reliability testing of aluminum and tantalum electrolytic capacitors. Microelectronics Reliability 42(6): 835-840 (2002)
3EEB. Trégon, Y. Ousten, Y. Danto, L. Béchou, B. Parmentier: Behavioral study of passive components and coating materials under isostatic pressure and temperature stress conditions. Microelectronics Reliability 42(7): 1113-1120 (2002)
2EEJ. Augereau, Y. Ousten, L. Béchou, Y. Danto: Acoustic analysis of an assembly: Structural identification by signal processing (wavelets). Microelectronics Reliability 42(9-11): 1517-1522 (2002)
1EEG. Duchamp, Y. Ousten, Y. Danto: Evaluation of a micropackaging analysis technique by highfrequency microwaves. Microelectronics Reliability 42(9-11): 1551-1554 (2002)

Coauthor Index

1G. Andriamonje [5]
2J. Augereau [2]
3L. Béchou [2] [3]
4T. Briolat [7]
5Wilfrid Claeys [5]
6Y. Danto [1] [2] [3] [4] [5] [6]
7A. Dehbi [4] [6] [7]
8Stefan Dilhaire [5]
9G. Duchamp [1]
10Y. Ezzahri [5]
11Stéphane Grauby [5]
12R. Humke [7]
13G. Lekens [7]
14P. Letullier [7]
15D. Lewis [5]
16B. Parmentier [3]
17H. A. Post [7]
18V. Pouget [5]
19J. M. Rampnoux [5]
20K. Saarinen [7]
21R. Schuhmann [7]
22B. Trégon [3]
23W. Werner [7]
24W. Wondrak [4] [6]

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)