| 2006 |
|---|
| 3 | EE | J. M. Rampnoux,
H. Michel,
M. Amine Salhi,
Stéphane Grauby,
Wilfrid Claeys,
Stefan Dilhaire:
Time gating imaging through thick silicon substrate: a new step towards backside characterisation.
Microelectronics Reliability 46(9-11): 1520-1524 (2006) |
| 2004 |
|---|
| 2 | EE | Josep Altet,
J. M. Rampnoux,
Jean-Christophe Batsale,
Stefan Dilhaire,
Antonio Rubio,
Wilfrid Claeys,
Stéphane Grauby:
Applications of temperature phase measurements to IC testing.
Microelectronics Reliability 44(1): 95-103 (2004) |
| 2003 |
|---|
| 1 | EE | G. Andriamonje,
V. Pouget,
Y. Ousten,
D. Lewis,
Y. Danto,
J. M. Rampnoux,
Y. Ezzahri,
Stefan Dilhaire,
Stéphane Grauby,
Wilfrid Claeys:
Application of Picosecond Ultrasonics to Non-Destructive Analysis in VLSI circuits.
Microelectronics Reliability 43(9-11): 1803-1807 (2003) |
