2001 | ||
---|---|---|
2 | EE | D. Lewis, Hervé Lapuyade, Yann Deval, Y. Maidon, F. Darracq, R. Briand, P. Fouillat: A New Laser System for X-Rays Flashes Sensitivity Evaluation. IOLTW 2001: 111- |
2000 | ||
1 | EE | Y. Maidon, Yann Deval, Jean-Baptiste Begueret: An Improved CMOS BICS for On-Line Testing. IOLTW 2000: 100- |
1 | Jean-Baptiste Begueret | [1] |
2 | R. Briand | [2] |
3 | F. Darracq | [2] |
4 | Yann Deval | [1] [2] |
5 | P. Fouillat | [2] |
6 | Hervé Lapuyade | [2] |
7 | D. Lewis | [2] |