Kanad Ghose, Patrick H. Madden, Vivek De, Peter M. Kogge (Eds.):
Proceedings of the 12th ACM Great Lakes Symposium on VLSI 2002, New York, NY, USA, April 18-19, 2002.
ACM 2002, ISBN 1-58113-462-2 BibTeX
@proceedings{DBLP:conf/glvlsi/2002,
editor = {Kanad Ghose and
Patrick H. Madden and
Vivek De and
Peter M. Kogge},
title = {Proceedings of the 12th ACM Great Lakes Symposium on VLSI 2002,
New York, NY, USA, April 18-19, 2002},
booktitle = {ACM Great Lakes Symposium on VLSI},
publisher = {ACM},
year = {2002},
isbn = {1-58113-462-2},
bibsource = {DBLP, http://dblp.uni-trier.de}
}
Low Power Design
- Joel Grodstein, Rachid Rayess, Tad Truex, Linda Shattuck, Sue Lowell, Dan Bailey, David Bertucci, Gabriel P. Bischoff, Daniel E. Dever, Mike Gowan, Roy Lane, Brian Lilly, Krishna Nagalla, Rahul Shah, Emily Shriver, Shi-Huang Yin, Shannon V. Morton:
Power and CAD considerations for the 1.75mbyte, 1.2ghz L2 cache on the alpha 21364 CPU.
1-6
Electronic Edition (ACM DL) BibTeX
- Vassilis Paliouras, Alexander Skavantzos, Thanos Stouraitis:
Multi-voltage low power convolvers using the polynomial residue number system.
7-11
Electronic Edition (ACM DL) BibTeX
- Andrey V. Mezhiba, Eby G. Friedman:
Properties of on-chip inductive current loops.
12-17
Electronic Edition (ACM DL) BibTeX
- Monica Donno, Luca Macchiarulo, Alberto Macii, Enrico Macii, Massimo Poncino:
Enhanced clustered voltage scaling for low power.
18-23
Electronic Edition (ACM DL) BibTeX
Energy and Delay Considerations
Testing and Fault-Tolerance
- Paolo Azzoni, Andrea Fedeli, Franco Fummi, Graziano Pravadelli, Umberto Rossi, Franco Toto:
An error simulation based approach to measure error coverage of formal properties.
53-58
Electronic Edition (ACM DL) BibTeX
- Alessandro Fin, Franco Fummi:
Protected IP-core test generation.
59-64
Electronic Edition (ACM DL) BibTeX
- Arun Krishnamachary, Jacob A. Abraham:
Test generation for resistive opens in CMOS.
65-70
Electronic Edition (ACM DL) BibTeX
- Ilya Levin, Vladimir Ostrovsky, Sergey Ostanin, Mark G. Karpovsky:
Self-checking sequential circuits with self-healing ability.
71-76
Electronic Edition (ACM DL) BibTeX
- Dan Zhao, Shambhu J. Upadhyaya, Martin Margala:
Minimizing concurrent test time in SoC's by balancing resource usage.
77-82
Electronic Edition (ACM DL) BibTeX
VLSI Design
VLSI Circuits
Design Automation
Potpourri
Copyright © Sat May 16 23:13:51 2009
by Michael Ley (ley@uni-trier.de)