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2003 | ||
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5 | EE | Arun Krishnamachary, Jacob A. Abraham: Effects of Multi-cycle Sensitization on Delay Tests. VLSI Design 2003: 137-142 |
2002 | ||
4 | EE | Arun Krishnamachary, Jacob A. Abraham: Test generation for resistive opens in CMOS. ACM Great Lakes Symposium on VLSI 2002: 65-70 |
3 | EE | Jacob A. Abraham, Arun Krishnamachary, Raghuram S. Tupuri: A Comprehensive Fault Model for Deep Submicron Digital Circuits. DELTA 2002: 360-364 |
2001 | ||
2 | EE | Arun Krishnamachary, Jacob A. Abraham, Raghuram S. Tupuri: Timing Verification and Delay Test Generation for Hierarchical Designs. VLSI Design 2001: 157-162 |
1999 | ||
1 | EE | Raghuram S. Tupuri, Arun Krishnamachary, Jacob A. Abraham: Test Generation for Gigahertz Processors Using an Automatic Functional Constraint Extractor. DAC 1999: 647-652 |
1 | Jacob A. Abraham | [1] [2] [3] [4] [5] |
2 | Raghuram S. Tupuri | [1] [2] [3] |