| |
| 2003 | ||
|---|---|---|
| 5 | EE | Arun Krishnamachary, Jacob A. Abraham: Effects of Multi-cycle Sensitization on Delay Tests. VLSI Design 2003: 137-142 |
| 2002 | ||
| 4 | EE | Arun Krishnamachary, Jacob A. Abraham: Test generation for resistive opens in CMOS. ACM Great Lakes Symposium on VLSI 2002: 65-70 |
| 3 | EE | Jacob A. Abraham, Arun Krishnamachary, Raghuram S. Tupuri: A Comprehensive Fault Model for Deep Submicron Digital Circuits. DELTA 2002: 360-364 |
| 2001 | ||
| 2 | EE | Arun Krishnamachary, Jacob A. Abraham, Raghuram S. Tupuri: Timing Verification and Delay Test Generation for Hierarchical Designs. VLSI Design 2001: 157-162 |
| 1999 | ||
| 1 | EE | Raghuram S. Tupuri, Arun Krishnamachary, Jacob A. Abraham: Test Generation for Gigahertz Processors Using an Automatic Functional Constraint Extractor. DAC 1999: 647-652 |
| 1 | Jacob A. Abraham | [1] [2] [3] [4] [5] |
| 2 | Raghuram S. Tupuri | [1] [2] [3] |