| |
| 2003 | ||
|---|---|---|
| 4 | EE | Hak-soo Yu, Sungbae Hwang, Jacob A. Abraham: DSP-Based Statistical Self Test of On-Chip Converters. VTS 2003: 83-88 |
| 3 | EE | Sungbae Hwang, Jacob A. Abraham: Test data compression and test time reduction using an embedded microprocessor. IEEE Trans. VLSI Syst. 11(5): 853-862 (2003) |
| 2002 | ||
| 2 | EE | Sungbae Hwang, Jacob A. Abraham: Selective-run built-in self-test using an embedded processor. ACM Great Lakes Symposium on VLSI 2002: 124-129 |
| 1 | EE | Sungbae Hwang, Jacob A. Abraham: Optimal BIST Using an Embedded Microprocessor. ITC 2002: 736-745 |
| 1 | Jacob A. Abraham | [1] [2] [3] [4] |
| 2 | Hak-soo Yu | [4] |