| 2005 |
|---|
| 6 | EE | Julien Pouget,
Erik Larsson,
Zebo Peng:
Multiple-Constraint Driven System-on-Chip Test Time Optimization.
J. Electronic Testing 21(6): 599-611 (2005) |
| 5 | EE | Erik Larsson,
Julien Pouget,
Zebo Peng:
Abort-on-Fail Based Test Scheduling.
J. Electronic Testing 21(6): 651-658 (2005) |
| 2004 |
|---|
| 4 | EE | Erik Larsson,
Julien Pouget,
Zebo Peng:
Defect-Aware SOC Test Scheduling.
VTS 2004: 361-366 |
| 2003 |
|---|
| 3 | EE | Julien Pouget,
Erik Larsson,
Zebo Peng:
SOC Test Time Minimization Under Multiple Constraints.
Asian Test Symposium 2003: 312-317 |
| 2002 |
|---|
| 2 | EE | Marie-Lise Flottes,
Julien Pouget,
Bruno Rouzeyre:
A Heuristic for Test Scheduling at System Level.
DATE 2002: 1124 |
| 2001 |
|---|
| 1 | | Marie-Lise Flottes,
Julien Pouget,
Bruno Rouzeyre:
Power-Constrained Test Scheduling for SoCs Under a "no session" Scheme.
VLSI-SOC 2001: 401-412 |
