| 2004 |
|---|
| 5 | EE | J. C. Wang,
Paulo Sérgio Cardoso,
J. A. Q. Gonzalez,
Marius Strum,
R. Pires:
Datapath BIST Insertion Using Pre-Characterized Area and Testability Data.
J. Electronic Testing 20(4): 333-344 (2004) |
| 1998 |
|---|
| 4 | EE | Marie-Lise Flottes,
R. Pires,
Bruno Rouzeyre:
Alleviating DFT Cost Using Testability Driven HLS.
Asian Test Symposium 1998: 46-51 |
| 3 | EE | Marie-Lise Flottes,
R. Pires,
Bruno Rouzeyre,
L. Volpe:
Scanning Datapaths: A Fast and Effective Partial Scan Selection Technique.
DATE 1998: 921-922 |
| 2 | EE | Marie-Lise Flottes,
R. Pires,
Bruno Rouzeyre,
L. Volpe:
Low Cost Partial Scan Design: A High Level Synthesis Approach.
VTS 1998: 332-340 |
| 1997 |
|---|
| 1 | EE | Marie-Lise Flottes,
R. Pires,
Bruno Rouzeyre:
Analyzing testability from behavioral to RT level.
ED&TC 1997: 158-165 |
