Vincent Beroulle

2008
18	EE	Xuan-Tu Tran, Yvain Thonnart, Jean Durupt, Vincent Beroulle, Chantal Robach: A Design-for-Test Implementation of an Asynchronous Network-on-Chip Architecture and its Associated Test Pattern Generation and Application. NOCS 2008: 149-158
17	EE	Yves Joannon, Vincent Beroulle, Chantal Robach, Smail Tedjini, Jean-Louis Carbonéro: Decreasing Test Qualification Time in AMS and RF Systems. IEEE Design & Test of Computers 25(1): 29-37 (2008)
2007
16	EE	Youssef Serrestou, Vincent Beroulle, Chantal Robach: Functional Verification of RTL Designs driven by Mutation Testing metrics. DSD 2007: 222-227
15	EE	Xuan-Tu Tran, Jean Durupt, Yvain Thonnart, François Bertrand, Vincent Beroulle, Chantal Robach: Implementation of a Design-for-Test Architecture for Asynchronous Networks-on-Chip. NOCS 2007: 216
14	EE	Yves Joannon, Vincent Beroulle, Chantal Robach, Smail Tedjini, Jean-Louis Carbonéro: Qualification of behavioral level design validation for AMS & RF SoCs. VLSI-SoC 2007: 206-211
13	EE	Youssef Serrestou, Vincent Beroulle, Chantal Robach: Impact of hardware emulation on the verification quality improvement. VLSI-SoC 2007: 218-223
12	EE	Mathieu Scholivé, Vincent Beroulle, Chantal Robach, Marie-Lise Flottes, Bruno Rouzeyre: Mutation Sampling Technique for the Generation of Structural Test Data CoRR abs/0710.4802: (2007)
2006
11		Yves Joannon, Vincent Beroulle, Rami Khouri, Chantal Robach, Smail Tedjini, Jean-Louis Carbonéro: Behavioral Modeling of WCDMA Transceiver with VHDL-AMS Language. DDECS 2006: 113-118
10		Xuan-Tu Tran, Vincent Beroulle, Jean Durupt, Chantal Robach, François Bertrand: Design-for-Test of Asynchronous Networks-on-Chip. DDECS 2006: 163-167
9		Youssef Serrestou, Vincent Beroulle, Chantal Robach: How to Improve a Set of Design Validation Data by Using Mutation-based Test. DDECS 2006: 77-78
8	EE	Xuan-Tu Tran, Jean Durupt, François Bertrand, Vincent Beroulle, Chantal Robach: A DFT Architecture for Asynchronous Networks-on-Chip. European Test Symposium 2006: 219-224
2005
7	EE	Mathieu Scholivé, Vincent Beroulle, Chantal Robach, Marie-Lise Flottes, Bruno Rouzeyre: Mutation Sampling Technique for the Generation of Structural Test Data. DATE 2005: 1022-1023
2004
6	EE	Laurent Latorre, Vincent Beroulle, Pascal Nouet: Design of CMOS MEMS based on mechanical resonators using a RF simulation approach. IEEE Trans. on CAD of Integrated Circuits and Systems 23(6): 962-967 (2004)
2002
5	EE	Vincent Beroulle, Yves Bertrand, Laurent Latorre, Pascal Nouet: On the Use of an Oscillation-Based Test Methodology for CMOS Micro-Electro-Mechanical Systems. DATE 2002: 1120
4	EE	Vincent Beroulle, Yves Bertrand, Laurent Latorre, Pascal Nouet: Evaluation of the Oscillation-based Test Methodology for Micro-Electro-Mechanical Systems. VTS 2002: 439-444
2001
3		Vincent Beroulle, Laurent Latorre, M. Dardalhon, C. Oudea, G. Perez, F. Pressecq, Pascal Nouet: Impact of Technology Spreading on MEMS design Robustness. VLSI-SOC 2001: 241-251
2		Vincent Beroulle, Yves Bertrand, Laurent Latorre, Pascal Nouet: Noise optimisation of a piezoresistive CMOS MEMS for magnetic field sensing. VLSI-SOC 2001: 461-472
1	EE	Vincent Beroulle, Yves Bertrand, Laurent Latorre, Pascal Nouet: Test and Testability of a Monolithic MEMS for Magnetic Field Sensing. J. Electronic Testing 17(5): 439-450 (2001)

Coauthor Index

1	François Bertrand	[8] [10] [15]
2	Yves Bertrand	[1] [2] [4] [5]
3	Jean-Louis Carbonéro	[11] [14] [17]
4	M. Dardalhon	[3]
5	Jean Durupt	[8] [10] [15] [18]
6	Marie-Lise Flottes	[7] [12]
7	Yves Joannon	[11] [14] [17]
8	Rami Khouri	[11]
9	Laurent Latorre	[1] [2] [3] [4] [5] [6]
10	Pascal Nouet	[1] [2] [3] [4] [5] [6]
11	C. Oudea	[3]
12	G. Perez	[3]
13	F. Pressecq	[3]
14	Chantal Robach	[7] [8] [9] [10] [11] [12] [13] [14] [15] [16] [17] [18]
15	Bruno Rouzeyre	[7] [12]
16	Mathieu Scholivé	[7] [12]
17	Youssef Serrestou	[9] [13] [16]
18	Smail Tedjini	[11] [14] [17]
19	Yvain Thonnart	[15] [18]
20	Xuan-Tu Tran	[8] [10] [15] [18]