| 2007 |
|---|
| 3 | EE | O. Ginez,
Jean Michel Daga,
Patrick Girard,
Christian Landrault,
Serge Pravossoudovitch,
Arnaud Virazel:
Electrical Simulation Model of the 2T-FLOTOX Core-Cell for Defect Injection and Faulty Behavior Prediction in eFlash Memories.
European Test Symposium 2007: 77-84 |
| 2 | EE | O. Ginez,
Jean Michel Daga,
Patrick Girard,
Christian Landrault,
Serge Pravossoudovitch,
Arnaud Virazel:
Retention and Reliability Problems in Embedded Flash Memories: Analysis and Test of Defective 2T-FLOTOX Tunnel Window.
VTS 2007: 47-52 |
| 2006 |
|---|
| 1 | EE | O. Ginez,
Jean Michel Daga,
Marylene Combe,
Patrick Girard,
Christian Landrault,
Serge Pravossoudovitch,
Arnaud Virazel:
An Overview of Failure Mechanisms in Embedded Flash Memories.
VTS 2006: 108-113 |
