| 1999 |
|---|
| 3 | EE | Patrick Girard,
Christian Landrault,
V. Moreda,
Serge Pravossoudovitch,
Arnaud Virazel:
A Scan-BIST Structure to Test Delay Faults in Sequential Circuits.
J. Electronic Testing 14(1-2): 95-102 (1999) |
| 1998 |
|---|
| 2 | EE | Patrick Girard,
Christian Landrault,
V. Moreda,
Serge Pravossoudovitch,
Arnaud Virazel:
A BIST Structure to Test Delay Faults in a Scan Environment.
Asian Test Symposium 1998: 435-439 |
| 1997 |
|---|
| 1 | EE | Patrick Girard,
Christian Landrault,
V. Moreda,
Serge Pravossoudovitch:
An optimized BIST test pattern generator for delay testing.
VTS 1997: 94-100 |
