| 2008 |
|---|
| 5 | EE | A. Ney,
Patrick Girard,
Serge Pravossoudovitch,
Arnaud Virazel,
Magali Bastian,
V. Gouin:
A Design-for-Diagnosis Technique for SRAM Write Drivers.
DATE 2008: 1480-1485 |
| 4 | EE | A. Ney,
Patrick Girard,
Serge Pravossoudovitch,
Arnaud Virazel,
Magali Bastian,
V. Gouin:
An SRAM Design-for-Diagnosis Solution Based on Write Driver Voltage Sensing.
VTS 2008: 89-94 |
| 2007 |
|---|
| 3 | EE | A. Ney,
Patrick Girard,
Christian Landrault,
Serge Pravossoudovitch,
Arnaud Virazel,
Magali Bastian:
Slow write driver faults in 65nm SRAM technology: analysis and March test solution.
DATE 2007: 528-533 |
| 2 | EE | A. Ney,
Patrick Girard,
Christian Landrault,
Serge Pravossoudovitch,
Arnaud Virazel,
Magali Bastian:
Dynamic Two-Cell Incorrect Read Fault Due to Resistive-Open Defects in the Sense Amplifiers of SRAMs.
European Test Symposium 2007: 97-104 |
| 1 | EE | A. Ney,
Patrick Girard,
Christian Landrault,
Serge Pravossoudovitch,
Arnaud Virazel,
Magali Bastian:
Un-Restored Destructive Write Faults Due to Resistive-Open Defects in the Write Driver of SRAMs.
VTS 2007: 361-368 |
