| 2006 |
|---|
| 3 | EE | M. Rodríguez-Irago,
Juan J. Rodríguez-Andina,
Fabian Vargas,
Jorge Semião,
Isabel C. Teixeira,
João Paulo Teixeira:
Dynamic Fault Detection in Digital Systems Using Dynamic Voltage Scaling and Multi-Temperature Schemes.
IOLTS 2006: 257-262 |
| 2005 |
|---|
| 2 | EE | M. Rodríguez-Irago,
Juan J. Rodríguez-Andina,
Fabian Vargas,
Marcelino B. Santos,
Isabel C. Teixeira,
João Paulo Teixeira:
Dynamic Fault Test and Diagnosis in Digital Systems Using Multiple Clock Schemes and Multi-VDD Test.
IOLTS 2005: 281-286 |
| 1 | EE | D. Barros Júnior,
M. Rodríguez-Irago,
Marcelino B. Santos,
Isabel C. Teixeira,
Fabian Vargas,
João Paulo Teixeira:
Fault Modeling and Simulation of Power Supply Voltage Transients in Digital Systems on a Chip.
J. Electronic Testing 21(4): 349-363 (2005) |
