Takashi Aikyo

2009
14	EE	Koji Yamazaki, Toshiyuki Tsutsumi, Hiroshi Takahashi, Yoshinobu Higami, Takashi Aikyo, Yuzo Takamatsu, Hiroyuki Yotsuyanagi, Masaki Hashizume: A Novel Approach for Improving the Quality of Open Fault Diagnosis. VLSI Design 2009: 85-90
13	EE	Hiroyuki Yotsuyanagi, Masaki Hashizume, Toshiyuki Tsutsumi, Koji Yamazaki, Takashi Aikyo, Yoshinobu Higami, Hiroshi Takahashi, Yuzo Takamatsu: Fault Effect of Open Faults Considering Adjacent Signal Lines in a 90 nm IC. VLSI Design 2009: 91-96
2008
12	EE	Kohei Miyase, Kenji Noda, Hideaki Ito, Kazumi Hatayama, Takashi Aikyo, Yuta Yamato, Hiroshi Furukawa, Xiaoqing Wen, Seiji Kajihara: Effective IR-drop reduction in at-speed scan testing using Distribution-Controlling X-Identification. ICCAD 2008: 52-58
11	EE	Yuzo Takamatsu, Hiroshi Takahashi, Yoshinobu Higami, Takashi Aikyo, Koji Yamazaki: Fault Diagnosis on Multiple Fault Models by Using Pass/Fail Information. IEICE Transactions 91-D(3): 675-682 (2008)
10	EE	Masayuki Arai, Satoshi Fukumoto, Kazuhiko Iwasaki, Tatsuru Matsuo, Takahisa Hiraide, Hideaki Konishi, Michiaki Emori, Takashi Aikyo: Test Data Compression for Scan-Based BIST Aiming at 100x Compression Rate. IEICE Transactions 91-D(3): 726-735 (2008)
9	EE	Hiroshi Takahashi, Yoshinobu Higami, Shuhei Kadoyama, Yuzo Takamatsu, Koji Yamazaki, Takashi Aikyo, Yasuo Sato: Post-BIST Fault Diagnosis for Multiple Faults. IEICE Transactions 91-D(3): 771-775 (2008)
2007
8	EE	Takashi Aikyo, Hiroshi Takahashi, Yoshinobu Higami, Junichi Ootsu, Kyohei Ono, Yuzo Takamatsu: Timing-Aware Diagnosis for Small Delay Defects. DFT 2007: 223-234
7	EE	Hiroshi Takahashi, Yoshinobu Higami, Toru Kikkawa, Takashi Aikyo, Yuzo Takamatsu, Hiroyuki Yotsuyanagi, Masaki Hashizume: Test Generation and Diagnostic Test Generation for Open Faults with Considering Adjacent Lines. DFT 2007: 243-251
6	EE	Seiji Kajihara, Shohei Morishima, Masahiro Yamamoto, Xiaoqing Wen, Masayasu Fukunaga, Kazumi Hatayama, Takashi Aikyo: Estimation of delay test quality and its application to test generation. ICCAD 2007: 413-417
2006
5	EE	Hiroshi Takahashi, Shuhei Kadoyama, Yoshinobu Higami, Yuzo Takamatsu, Koji Yamazaki, Takashi Aikyo, Yasuo Sato: Effective Post-BIST Fault Diagnosis for Multiple Faults. DFT 2006: 401-109
2000
4	EE	Takashi Aikyo: Issues on SOC testing in DSM area: embedded tutorial. ASP-DAC 2000: 515-516
1997
3	EE	Michiaki Emori, Junko Kumagai, Koichi Itaya, Takashi Aikyo, Tomoko Anan, Junichi Niimi: ATREX : Design for Testability System for Mega Gate LSIs. Asian Test Symposium 1997: 126-
2	EE	Douglas Chang, Mike Tien-Chien Lee, Malgorzata Marek-Sadowska, Takashi Aikyo, Kwang-Ting Cheng: A Test Synthesis Approach to Reducing BALLAST DFT Overhead. DAC 1997: 466-471
1986
1		Takashi Aikyo, Y. Hatano, J. Ishii, N. Karasawa, S. Fujii: An Automatic Test Generation System for Large Scale Gate Arrays. COMPCON 1986: 445-451

Coauthor Index

1	Tomoko Anan	[3]
2	Masayuki Arai	[10]
3	Douglas Chang	[2]
4	Kwang-Ting Cheng (Kwang-Ting (Tim) Cheng)	[2]
5	Michiaki Emori	[3] [10]
6	S. Fujii	[1]
7	Satoshi Fukumoto	[10]
8	Masayasu Fukunaga	[6]
9	Hiroshi Furukawa	[12]
10	Masaki Hashizume	[7] [13] [14]
11	Y. Hatano	[1]
12	Kazumi Hatayama	[6] [12]
13	Yoshinobu Higami	[5] [7] [8] [9] [11] [13] [14]
14	Takahisa Hiraide	[10]
15	J. Ishii	[1]
16	Koichi Itaya	[3]
17	Hideaki Ito	[12]
18	Kazuhiko Iwasaki	[10]
19	Shuhei Kadoyama	[5] [9]
20	Seiji Kajihara	[6] [12]
21	N. Karasawa	[1]
22	Toru Kikkawa	[7]
23	Hideaki Konishi	[10]
24	Junko Kumagai	[3]
25	Mike Tien-Chien Lee	[2]
26	Malgorzata Marek-Sadowska	[2]
27	Tatsuru Matsuo	[10]
28	Kohei Miyase	[12]
29	Shohei Morishima	[6]
30	Junichi Niimi	[3]
31	Kenji Noda	[12]
32	Kyohei Ono	[8]
33	Junichi Ootsu	[8]
34	Yasuo Sato	[5] [9]
35	Hiroshi Takahashi	[5] [7] [8] [9] [11] [13] [14]
36	Yuzo Takamatsu	[5] [7] [8] [9] [11] [13] [14]
37	Toshiyuki Tsutsumi	[13] [14]
38	Xiaoqing Wen	[6] [12]
39	Masahiro Yamamoto	[6]
40	Yuta Yamato	[12]
41	Koji Yamazaki	[5] [9] [11] [13] [14]
42	Hiroyuki Yotsuyanagi	[7] [13] [14]

Colors in the list of coauthors