Hidekazu Ayano

2003
1	EE	Hiroshi Takahashi, Yasunori Tsugaoka, Hidekazu Ayano, Yuzo Takamatsu: BIST Based Fault Diagnosis Using Ambiguous Test Set. DFT 2003: 89-96

Coauthor Index

1	Hiroshi Takahashi	[1]
2	Yuzo Takamatsu	[1]
3	Yasunori Tsugaoka	[1]