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2007 | ||
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1 | EE | Hiroshi Takahashi, Yoshinobu Higami, Toru Kikkawa, Takashi Aikyo, Yuzo Takamatsu, Hiroyuki Yotsuyanagi, Masaki Hashizume: Test Generation and Diagnostic Test Generation for Open Faults with Considering Adjacent Lines. DFT 2007: 243-251 |
1 | Takashi Aikyo | [1] |
2 | Masaki Hashizume | [1] |
3 | Yoshinobu Higami | [1] |
4 | Hiroshi Takahashi | [1] |
5 | Yuzo Takamatsu | [1] |
6 | Hiroyuki Yotsuyanagi | [1] |