| |
| 2007 | ||
|---|---|---|
| 1 | EE | Hiroshi Takahashi, Yoshinobu Higami, Toru Kikkawa, Takashi Aikyo, Yuzo Takamatsu, Hiroyuki Yotsuyanagi, Masaki Hashizume: Test Generation and Diagnostic Test Generation for Open Faults with Considering Adjacent Lines. DFT 2007: 243-251 |
| 1 | Takashi Aikyo | [1] |
| 2 | Masaki Hashizume | [1] |
| 3 | Yoshinobu Higami | [1] |
| 4 | Hiroshi Takahashi | [1] |
| 5 | Yuzo Takamatsu | [1] |
| 6 | Hiroyuki Yotsuyanagi | [1] |