| |
| 1997 | ||
|---|---|---|
| 2 | EE | Hiroshi Takahashi, Kwame Osei Boateng, Yuzo Takamatsu, Toshiyuki Matsunaga: A Method of Generating Tests for Marginal Delays an Delay Faults in Combinational Circuits. Asian Test Symposium 1997: 320-325 |
| 1 | EE | Hiroshi Takahashi, Takashi Watanabe, Toshiyuki Matsunaga, Yuzo Takamatsu: Tests for small gate delay faults in combinational circuits and a test generation method. Systems and Computers in Japan 28(6): 68-76 (1997) |
| 1 | Kwame Osei Boateng | [2] |
| 2 | Hiroshi Takahashi | [1] [2] |
| 3 | Yuzo Takamatsu | [1] [2] |
| 4 | Takashi Watanabe | [1] |