| |
| 2005 | ||
|---|---|---|
| 3 | Charles E. Stroud, Srinivas M. Garimella, John Sunwoo: On-Chip BIST-Based Diagnosis of Embedded Programmable Logic Cores in System-on-Chip Devices. Computers and Their Applications 2005: 308-313 | |
| 2 | Srinivas M. Garimella, Charles E. Stroud: Built-In Self-Test and Diagnosis of Multiple Embedded Cores in SoCs. ESA 2005: 130-136 | |
| 2004 | ||
| 1 | EE | Charles E. Stroud, John Sunwoo, Srinivas M. Garimella, Jonathan Harris: Built-In Self-Test for System-on-Chip: A Case Study. ITC 2004: 837-846 |
| 1 | Jonathan Harris | [1] |
| 2 | Charles E. Stroud | [1] [2] [3] |
| 3 | John Sunwoo | [1] [3] |