Journal of Electronic Testing, Volume 7

Volume 7, Numbers 1-2, August 1995

• Vishwani D. Agrawal:
  Editorial - Special issue on partial scan design. 5-6
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• Johannes Steensma, Francky Catthoor, Hugo De Man:
  Partial scan and symbolic test at the register-transfer level. 7-23
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• Rajesh Gupta, Melvin A. Breuer:
  Partial scan design of register-transfer level circuits. 25-46
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• Kee Sup Kim, Charles R. Kime:
  Partial scan flip-flop selection by use of empirical testability. 47-59
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• Prashant S. Parikh, Miron Abramovici:
  Testability-based partial scan analysis. 61-70
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• Tatiana Orenstein, Zvi Kohavi, Irith Pomeranz:
  An optimal algorithm for cycle breaking in directed graphs. 71-81
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• Srimat T. Chakradhar, Arun Balakrishnan, Vishwani D. Agrawal:
  An exact algorithm for selecting partial scan flip-flops. 83-93
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• Shang-E Tai, Debashis Bhattacharya:
  A three-stage partial scan design method to ease ATPG. 95-104
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• Sujit Dey, Srimat T. Chakradhar:
  Design of testable sequential circuits by repositioning flip-flops. 105-114
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• Yoshinobu Higami, Seiji Kajihara, Kozo Kinoshita:
  Partial scan design and test sequence generation based on reduced scan shift method. 115-124
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• Chih-Jen Lin, Yervant Zorian, Sudipta Bhawmik:
  Integration of partial scan and built-in self-test. 125-137
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Volume 7, Number 3, December 1995

• Vishwani D. Agrawal:
  Editorial. 143
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• Andrea Boni, G. Chiorboli, G. Franco, M. Ostacoli, S. Mazzoleni:
  Short test procedures for R-2R D/A converters by electrical modeling and application of the ambiguity algorithm. 145-155
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• Ankan K. Pramanick, Sudhakar M. Reddy:
  Efficient multiple path propagating tests for delay faults. 157-172
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• Harry Hengster, Rolf Drechsler, Bernd Becker:
  On local transformations and path delay fault testability. 173-191
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• T. Raju Damarla, Charles E. Stroud, Avinash Sathaye:
  Multiple error detection and identification via signature analysis. 193-207
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• Shujian Zhang, Rod Byrne, Jon C. Muzio, D. Michael Miller:
  Quantitative analysis for linear hybrid cellular automata and LFSR as built-in self-test generators for sequential faults. 209-221
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• Claudio Costi, Micaela Serra, Donatella Sciuto:
  A new DFT methodology for sequential circuits. 223-240
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• Leendert M. Huisman:
  Yield fluctuations and defect models. 241-254
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• V. C. Prasad, N. Sarat Chandra Babu:
  On minimal set of test nodes for fault dictionary of analog circuit fault diagnosis. 255-258
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