Joe K. Tannehill Jr.
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1998
1
EE
Charles E. Stroud
, Joe K. Tannehill Jr.: Applying Built-In Self-Test to Majority Voting Fault Tolerant Circuits.
VTS 1998
: 303-308
Coauthor
Index
1
Charles E. Stroud
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Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)