| 2007 |
|---|
| 5 | EE | Tsu-Wei Tseng,
Chun-Hsien Wu,
Yu-Jen Huang,
Jin-Fu Li,
Alex Pao,
Kevin Chiu,
Eliot Chen:
A Built-In Self-Repair Scheme for Multiport RAMs.
VTS 2007: 355-360 |
| 4 | EE | Jin-Fu Li,
Tsu-Wei Tseng,
Chin-Long Wey:
An Efficient Transparent Test Scheme for Embedded Word-Oriented Memories
CoRR abs/0710.4747: (2007) |
| 3 | EE | Chao-Da Huang,
Jin-Fu Li,
Tsu-Wei Tseng:
ProTaR: An Infrastructure IP for Repairing RAMs in System-on-Chips.
IEEE Trans. VLSI Syst. 15(10): 1135-1143 (2007) |
| 2006 |
|---|
| 2 | EE | Tsu-Wei Tseng,
Jin-Fu Li,
Da-Ming Chang:
A built-in redundancy-analysis scheme for RAMs with 2D redundancy using 1D local bitmap.
DATE 2006: 53-58 |
| 2005 |
|---|
| 1 | EE | Jin-Fu Li,
Tsu-Wei Tseng,
Chin-Long Wey:
An Efficient Transparent Test Scheme for Embedded Word-Oriented Memories.
DATE 2005: 574-579 |
