| 2008 |
|---|
| 5 | EE | Da-Ming Chang,
Jin-Fu Li,
Yu-Jen Huang:
A Built-In Redundancy-Analysis Scheme for Random Access Memories with Two-Level Redundancy.
J. Electronic Testing 24(1-3): 181-192 (2008) |
| 2007 |
|---|
| 4 | EE | Tsu-Wei Tseng,
Chun-Hsien Wu,
Yu-Jen Huang,
Jin-Fu Li,
Alex Pao,
Kevin Chiu,
Eliot Chen:
A Built-In Self-Repair Scheme for Multiport RAMs.
VTS 2007: 355-360 |
| 2006 |
|---|
| 3 | EE | Yu-Jen Huang,
Da-Ming Chang,
Jin-Fu Li:
A Built-In Redundancy-Analysis Scheme for Self-Repairable RAMs with Two-Level Redundancy.
DFT 2006: 362-370 |
| 2 | EE | Yu-Jen Huang,
Jin-Fu Li:
Testing Active Neighborhood Pattern-Sensitive Faults of Ternary Content Addressable Memories.
European Test Symposium 2006: 55-62 |
| 2005 |
|---|
| 1 | EE | Jin-Fu Li,
Jiunn-Der Yu,
Yu-Jen Huang:
A design methodology for hybrid carry-lookahead/carry-select adders with reconfigurability.
ISCAS (1) 2005: 77-80 |
