| |
| 2008 | ||
|---|---|---|
| 3 | EE | Da-Ming Chang, Jin-Fu Li, Yu-Jen Huang: A Built-In Redundancy-Analysis Scheme for Random Access Memories with Two-Level Redundancy. J. Electronic Testing 24(1-3): 181-192 (2008) |
| 2006 | ||
| 2 | EE | Tsu-Wei Tseng, Jin-Fu Li, Da-Ming Chang: A built-in redundancy-analysis scheme for RAMs with 2D redundancy using 1D local bitmap. DATE 2006: 53-58 |
| 1 | EE | Yu-Jen Huang, Da-Ming Chang, Jin-Fu Li: A Built-In Redundancy-Analysis Scheme for Self-Repairable RAMs with Two-Level Redundancy. DFT 2006: 362-370 |
| 1 | Yu-Jen Huang | [1] [3] |
| 2 | Jin-Fu Li | [1] [2] [3] |
| 3 | Tsu-Wei Tseng | [2] |