| |
| 2004 | ||
|---|---|---|
| 1 | EE | Xinli Gu, Cyndee Wang, Abby Lee, Bill Eklow, Kun-Han Tsai, Jan Arild Tofte, Mark Kassab, Janusz Rajski: Realizing High Test Quality Goals with Smart Test Resource Usage. ITC 2004: 525-533 |
| 1 | Bill Eklow (William Eklow) | [1] |
| 2 | Xinli Gu | [1] |
| 3 | Mark Kassab | [1] |
| 4 | Janusz Rajski | [1] |
| 5 | Jan Arild Tofte | [1] |
| 6 | Kun-Han Tsai | [1] |
| 7 | Cyndee Wang | [1] |