2004 |
3 | EE | Xinli Gu,
Cyndee Wang,
Abby Lee,
Bill Eklow,
Kun-Han Tsai,
Jan Arild Tofte,
Mark Kassab,
Janusz Rajski:
Realizing High Test Quality Goals with Smart Test Resource Usage.
ITC 2004: 525-533 |
2001 |
2 | | Xinli Gu,
Sung Soo Chung,
Frank Tsang,
Jan Arild Tofte,
Hamid Rahmanian:
An effort-minimized logic BIST implementation method.
ITC 2001: 1002-1010 |
2000 |
1 | EE | Jan Arild Tofte,
Chee-Kian Ong,
Jiun-Lang Huang,
Kwang-Ting (Tim) Cheng:
Characterization of a Pseudo-Random Testing Technique for Analog and Mixed-Signal Built-in-Self-Test.
VTS 2000: 237-246 |