2003 | ||
---|---|---|
2 | EE | Xijiang Lin, Rob Thompson: Test generation for designs with multiple clocks. DAC 2003: 662-667 |
2002 | ||
1 | EE | Janusz Rajski, Jerzy Tyszer, Mark Kassab, Nilanjan Mukherjee, Rob Thompson, Kun-Han Tsai, Andre Hertwig, Nagesh Tamarapalli, Grzegorz Mrugalski, Geir Eide, Jun Qian: Embedded Deterministic Test for Low-Cost Manufacturing Test. ITC 2002: 301-310 |
1 | Geir Eide | [1] |
2 | Andre Hertwig | [1] |
3 | Mark Kassab | [1] |
4 | Xijiang Lin | [2] |
5 | Grzegorz Mrugalski | [1] |
6 | Nilanjan Mukherjee | [1] |
7 | Jun Qian | [1] |
8 | Janusz Rajski | [1] |
9 | Nagesh Tamarapalli | [1] |
10 | Kun-Han Tsai | [1] |
11 | Jerzy Tyszer | [1] |