Rob Thompson

2003
2	EE	Xijiang Lin, Rob Thompson: Test generation for designs with multiple clocks. DAC 2003: 662-667
2002
1	EE	Janusz Rajski, Jerzy Tyszer, Mark Kassab, Nilanjan Mukherjee, Rob Thompson, Kun-Han Tsai, Andre Hertwig, Nagesh Tamarapalli, Grzegorz Mrugalski, Geir Eide, Jun Qian: Embedded Deterministic Test for Low-Cost Manufacturing Test. ITC 2002: 301-310

Coauthor Index

1	Geir Eide	[1]
2	Andre Hertwig	[1]
3	Mark Kassab	[1]
4	Xijiang Lin	[2]
5	Grzegorz Mrugalski	[1]
6	Nilanjan Mukherjee	[1]
7	Jun Qian	[1]
8	Janusz Rajski	[1]
9	Nagesh Tamarapalli	[1]
10	Kun-Han Tsai	[1]
11	Jerzy Tyszer	[1]