| |
| 2003 | ||
|---|---|---|
| 1 | EE | Brady Benware, Chris Schuermyer, Sreenevasan Ranganathan, Robert Madge, Prabhu Krishnamurthy, Nagesh Tamarapalli, Kun-Han Tsai, Janusz Rajski: Impact of Multiple-Detect Test Patterns on Product Quality. ITC 2003: 1031-1040 |
| 1 | Brady Benware | [1] |
| 2 | Prabhu Krishnamurthy | [1] |
| 3 | Robert Madge | [1] |
| 4 | Janusz Rajski | [1] |
| 5 | Chris Schuermyer | [1] |
| 6 | Nagesh Tamarapalli | [1] |
| 7 | Kun-Han Tsai | [1] |