| 2005 |
|---|
| 3 | EE | Prabhu Krishnamurthy:
The Ultimate Chase.
Asian Test Symposium 2005: 454 |
| 2004 |
|---|
| 2 | EE | Brady Benware,
Cam Lu,
John Van Slyke,
Prabhu Krishnamurthy,
Robert Madge,
Martin Keim,
Mark Kassab,
Janusz Rajski:
Affordable and Effective Screening of Delay Defects in ASICs using the Inline Resistance Fault Model.
ITC 2004: 1285-1294 |
| 2003 |
|---|
| 1 | EE | Brady Benware,
Chris Schuermyer,
Sreenevasan Ranganathan,
Robert Madge,
Prabhu Krishnamurthy,
Nagesh Tamarapalli,
Kun-Han Tsai,
Janusz Rajski:
Impact of Multiple-Detect Test Patterns on Product Quality.
ITC 2003: 1031-1040 |
