Stefan Eichenberger

2008
14	EE	Daniel Arumí, Rosa Rodríguez-Montañés, Joan Figueras, Stefan Eichenberger, Camelia Hora, Bram Kruseman: Full Open Defects in Nanometric CMOS. VTS 2008: 119-124
2007
13	EE	Daniel Arumí, Rosa Rodríguez-Montañés, Joan Figueras, Stefan Eichenberger, Camelia Hora, Bram Kruseman, Maurice Lousberg, Ananta K. Majhi: Diagnosis of Bridging Defects Based on Current Signatures at Low Power Supply Voltages. VTS 2007: 145-150
12	EE	Rosa Rodríguez-Montañés, Daniel Arumí, Joan Figueras, Stefan Eichenberger, Camelia Hora, Bram Kruseman, Maurice Lousberg, Ananta K. Majhi: Diagnosis of Full Open Defects in Interconnecting Lines. VTS 2007: 158-166
11	EE	Ananta K. Majhi, Mohamed Azimane, Guido Gronthoud, Maurice Lousberg, Stefan Eichenberger, Fred Bowen: Memory Testing Under Different Stress Conditions: An Industrial Evaluation CoRR abs/0710.4693: (2007)
10	EE	Jing Wang, Duncan M. Hank Walker, Xiang Lu, Ananta K. Majhi, Bram Kruseman, Guido Gronthoud, Luis Elvira Villagra, Paul J. A. M. van de Wiel, Stefan Eichenberger: Modeling Power Supply Noise in Delay Testing. IEEE Design & Test of Computers 24(3): 226-234 (2007)
2005
9	EE	Ananta K. Majhi, Mohamed Azimane, Guido Gronthoud, Maurice Lousberg, Stefan Eichenberger, Fred Bowen: Memory Testing Under Different Stress Conditions: An Industrial Evaluation. DATE 2005: 438-443
2004
8	EE	Bram Kruseman, Ananta K. Majhi, Guido Gronthoud, Stefan Eichenberger: On Hazard-free Patterns for Fine-delay Fault Testing. ITC 2004: 213-222
7	EE	Bram Kruseman, Ananta K. Majhi, Camelia Hora, Stefan Eichenberger, Johan Meirlevede: Systematic Defects in Deep Sub-Micron Technologies. ITC 2004: 290-299
6	EE	Subhasish Mitra, Erik H. Volkerink, Edward J. McCluskey, Stefan Eichenberger: Delay Defect Screening using Process Monitor Structures. VTS 2004: 43-52
5		Rob Aitken, Stefan Eichenberger, Gary Maier, Sandip Kundu, Hank Walker: ITC 2003 Roundtable: Design for Manufacturability. IEEE Design & Test of Computers 21(2): 144-156 (2004)
2003
4	EE	Stefan Eichenberger: Design for Manufacturability - or the meaning of 'subtle'. ITC 2003: 1316
3	EE	Ananta K. Majhi, Guido Gronthoud, Camelia Hora, Maurice Lousberg, Pop Valer, Stefan Eichenberger: Improving Diagnostic Resolution of Delay Faults using Path Delay Fault Model. VTS 2003: 345-350
2	EE	Camelia Hora, Rene Segers, Stefan Eichenberger, Maurice Lousberg: On a Statistical Fault Diagnosis Approach Enabling Fast Yield Ramp-Up. J. Electronic Testing 19(4): 369-376 (2003)
2002
1	EE	Camelia Hora, Rene Segers, Stefan Eichenberger, Maurice Lousberg: An Effective Diagnosis Method to Support Yield Improvement. ITC 2002: 260-269

Coauthor Index

1	Rob Aitken	[5]
2	Daniel Arumí	[12] [13] [14]
3	Mohamed Azimane	[9] [11]
4	Fred Bowen	[9] [11]
5	Joan Figueras	[12] [13] [14]
6	Guido Gronthoud	[3] [8] [9] [10] [11]
7	Camelia Hora	[1] [2] [3] [7] [12] [13] [14]
8	Bram Kruseman	[7] [8] [10] [12] [13] [14]
9	Sandip Kundu	[5]
10	Maurice Lousberg	[1] [2] [3] [9] [11] [12] [13]
11	Xiang Lu	[10]
12	Gary Maier	[5]
13	Ananta K. Majhi	[3] [7] [8] [9] [10] [11] [12] [13]
14	Edward J. McCluskey	[6]
15	Johan Meirlevede	[7]
16	Subhasish Mitra	[6]
17	Rosa Rodríguez-Montañés	[12] [13] [14]
18	Rene Segers	[1] [2]
19	Pop Valer	[3]
20	Luis Elvira Villagra	[10]
21	Erik H. Volkerink	[6]
22	D. M. H. Walker (Duncan M. Hank Walker)	[10]
23	Hank Walker	[5]
24	Jing Wang	[10]
25	Paul J. A. M. van de Wiel	[10]

Colors in the list of coauthors