| 2006 |
|---|
| 10 | EE | Josep Rius,
Maurice Meijer,
José Pineda de Gyvez:
An Activity Monitor for Power/Performance Tuning of CMOS Digital Circuits.
J. Low Power Electronics 2(1): 80-86 (2006) |
| 2005 |
|---|
| 9 | EE | Josep Rius,
José Pineda de Gyvez,
Maurice Meijer:
An Activity Monitor for Power/Performance Tuning of CMOS Digital Circuits.
PATMOS 2005: 187-196 |
| 2004 |
|---|
| 8 | EE | Salvador Manich,
L. García,
L. Balado,
E. Lupon,
Josep Rius,
Rosa Rodríguez-Montañés,
Joan Figueras:
BIST Technique by Equally Spaced Test Vector Sequences.
VTS 2004: 206-216 |
| 2003 |
|---|
| 7 | EE | Josep Rius,
Alejandro Peidro,
Salvador Manich,
Rosa Rodriguez-Sánchez:
Power and Energy Consumption of CMOS Circuits: Measurement Methods and Experimental Results.
PATMOS 2003: 80-89 |
| 2002 |
|---|
| 6 | EE | Bram Kruseman,
Stefan van den Oetelaar,
Josep Rius:
Comparison of IDDQ Testing and Very-Low Voltage Testing.
ITC 2002: 964-973 |
| 1999 |
|---|
| 5 | EE | Josep Rius,
Joan Figueras:
Exploring the Combination of IDDQ and iDDt Testing: Energy Testing.
DATE 1999: 543-548 |
| 1998 |
|---|
| 4 | EE | Antoni Ferré,
Eugeni Isern,
Josep Rius,
Rosa Rodríguez-Montañés,
Joan Figueras:
IDDQ testing: state of the art and future trends.
Integration 26(1-2): 167-196 (1998) |
| 1996 |
|---|
| 3 | EE | Josep Rius,
Joan Figueras:
Dynamic characterization of Built-In Current Sensors based on PN junctions: Analysis and experiments.
J. Electronic Testing 9(3): 295-310 (1996) |
| 1995 |
|---|
| 2 | EE | Josep Rius,
Joan Figueras:
Detecting I/sub DDQ/ defective CMOS circuits by depowering.
VTS 1995: 324-329 |
| 1992 |
|---|
| 1 | EE | Josep Rius,
Joan Figueras:
Proportional BIC sensor for current testing.
J. Electronic Testing 3(4): 387-396 (1992) |
