| 2008 |
|---|
| 4 | EE | Daniel Arumí,
Rosa Rodríguez-Montañés,
Joan Figueras,
Stefan Eichenberger,
Camelia Hora,
Bram Kruseman:
Full Open Defects in Nanometric CMOS.
VTS 2008: 119-124 |
| 3 | EE | Daniel Arumí,
Rosa Rodríguez-Montañés,
Joan Figueras:
Experimental Characterization of CMOS Interconnect Open Defects.
IEEE Trans. on CAD of Integrated Circuits and Systems 27(1): 123-136 (2008) |
| 2007 |
|---|
| 2 | EE | Daniel Arumí,
Rosa Rodríguez-Montañés,
Joan Figueras,
Stefan Eichenberger,
Camelia Hora,
Bram Kruseman,
Maurice Lousberg,
Ananta K. Majhi:
Diagnosis of Bridging Defects Based on Current Signatures at Low Power Supply Voltages.
VTS 2007: 145-150 |
| 1 | EE | Rosa Rodríguez-Montañés,
Daniel Arumí,
Joan Figueras,
Stefan Eichenberger,
Camelia Hora,
Bram Kruseman,
Maurice Lousberg,
Ananta K. Majhi:
Diagnosis of Full Open Defects in Interconnecting Lines.
VTS 2007: 158-166 |
