Paul Volf
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2002
1
EE
Rosa Rodríguez-Montañés
, Paul Volf,
José Pineda de Gyvez
: Resistance Characterization for Weak Open Defects.
IEEE Design & Test of Computers 19
(5): 18-26 (2002)
Coauthor
Index
1
José Pineda de Gyvez
[
1
]
2
Rosa Rodríguez-Montañés
[
1
]
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)
