| 2008 |
|---|
| 9 | EE | Daniel Arumí,
Rosa Rodríguez-Montañés,
Joan Figueras,
Stefan Eichenberger,
Camelia Hora,
Bram Kruseman:
Full Open Defects in Nanometric CMOS.
VTS 2008: 119-124 |
| 2007 |
|---|
| 8 | EE | Daniel Arumí,
Rosa Rodríguez-Montañés,
Joan Figueras,
Stefan Eichenberger,
Camelia Hora,
Bram Kruseman,
Maurice Lousberg,
Ananta K. Majhi:
Diagnosis of Bridging Defects Based on Current Signatures at Low Power Supply Voltages.
VTS 2007: 145-150 |
| 7 | EE | Rosa Rodríguez-Montañés,
Daniel Arumí,
Joan Figueras,
Stefan Eichenberger,
Camelia Hora,
Bram Kruseman,
Maurice Lousberg,
Ananta K. Majhi:
Diagnosis of Full Open Defects in Interconnecting Lines.
VTS 2007: 158-166 |
| 2006 |
|---|
| 6 | EE | Xinyue Fan,
Will Moore,
Camelia Hora,
Mario H. Konijnenburg,
Guido Gronthoud:
A Gate-Level Method for Transistor-Level Bridging Fault Diagnosis.
VTS 2006: 266-271 |
| 2004 |
|---|
| 5 | EE | Bram Kruseman,
Ananta K. Majhi,
Camelia Hora,
Stefan Eichenberger,
Johan Meirlevede:
Systematic Defects in Deep Sub-Micron Technologies.
ITC 2004: 290-299 |
| 4 | EE | Bart Vermeulen,
Camelia Hora,
Bram Kruseman,
Erik Jan Marinissen,
Robert Van Rijsinge:
Trends in Testing Integrated Circuits.
ITC 2004: 688-697 |
| 2003 |
|---|
| 3 | EE | Ananta K. Majhi,
Guido Gronthoud,
Camelia Hora,
Maurice Lousberg,
Pop Valer,
Stefan Eichenberger:
Improving Diagnostic Resolution of Delay Faults using Path Delay Fault Model.
VTS 2003: 345-350 |
| 2 | EE | Camelia Hora,
Rene Segers,
Stefan Eichenberger,
Maurice Lousberg:
On a Statistical Fault Diagnosis Approach Enabling Fast Yield Ramp-Up.
J. Electronic Testing 19(4): 369-376 (2003) |
| 2002 |
|---|
| 1 | EE | Camelia Hora,
Rene Segers,
Stefan Eichenberger,
Maurice Lousberg:
An Effective Diagnosis Method to Support Yield Improvement.
ITC 2002: 260-269 |
