Bram Kruseman

2008
13	EE	Daniel Arumí, Rosa Rodríguez-Montañés, Joan Figueras, Stefan Eichenberger, Camelia Hora, Bram Kruseman: Full Open Defects in Nanometric CMOS. VTS 2008: 119-124
2007
12	EE	Daniel Arumí, Rosa Rodríguez-Montañés, Joan Figueras, Stefan Eichenberger, Camelia Hora, Bram Kruseman, Maurice Lousberg, Ananta K. Majhi: Diagnosis of Bridging Defects Based on Current Signatures at Low Power Supply Voltages. VTS 2007: 145-150
11	EE	Rosa Rodríguez-Montañés, Daniel Arumí, Joan Figueras, Stefan Eichenberger, Camelia Hora, Bram Kruseman, Maurice Lousberg, Ananta K. Majhi: Diagnosis of Full Open Defects in Interconnecting Lines. VTS 2007: 158-166
10	EE	Bram Kruseman, Ananta K. Majhi, Guido Gronthoud: On Performance Testing with Path Delay Patterns. VTS 2007: 29-34
9	EE	Jing Wang, Duncan M. Hank Walker, Xiang Lu, Ananta K. Majhi, Bram Kruseman, Guido Gronthoud, Luis Elvira Villagra, Paul J. A. M. van de Wiel, Stefan Eichenberger: Modeling Power Supply Noise in Delay Testing. IEEE Design & Test of Computers 24(3): 226-234 (2007)
2006
8	EE	Bram Kruseman, Manuel Heiligers: On test conditions for the detection of open defects. DATE 2006: 896-901
2004
7	EE	Bram Kruseman, Ananta K. Majhi, Guido Gronthoud, Stefan Eichenberger: On Hazard-free Patterns for Fine-delay Fault Testing. ITC 2004: 213-222
6	EE	Bram Kruseman, Ananta K. Majhi, Camelia Hora, Stefan Eichenberger, Johan Meirlevede: Systematic Defects in Deep Sub-Micron Technologies. ITC 2004: 290-299
5	EE	Bart Vermeulen, Camelia Hora, Bram Kruseman, Erik Jan Marinissen, Robert Van Rijsinge: Trends in Testing Integrated Circuits. ITC 2004: 688-697
2003
4	EE	Bram Kruseman, Stefan van den Oetelaar: Detection of Resistive Shorts in Deep Sub-micron Technologies. ITC 2003: 866-875
2002
3	EE	Bram Kruseman, Stefan van den Oetelaar, Josep Rius: Comparison of IDDQ Testing and Very-Low Voltage Testing. ITC 2002: 964-973
2001
2		Bram Kruseman, Rudger van Veen, Kees van Kaam: The future of delta I_DDQ testing. ITC 2001: 101-110
1999
1		Bram Kruseman, Peter Janssen, Victor Zieren: Transient current testing of 0.25 /spl mu/m CMOS devices. ITC 1999: 47-56

Coauthor Index

1	Daniel Arumí	[11] [12] [13]
2	Stefan Eichenberger	[6] [7] [9] [11] [12] [13]
3	Joan Figueras	[11] [12] [13]
4	Guido Gronthoud	[7] [9] [10]
5	Manuel Heiligers	[8]
6	Camelia Hora	[5] [6] [11] [12] [13]
7	Peter Janssen	[1]
8	Kees van Kaam	[2]
9	Maurice Lousberg	[11] [12]
10	Xiang Lu	[9]
11	Ananta K. Majhi	[6] [7] [9] [10] [11] [12]
12	Erik Jan Marinissen	[5]
13	Johan Meirlevede	[6]
14	Stefan van den Oetelaar	[3] [4]
15	Robert Van Rijsinge	[5]
16	Josep Rius	[3]
17	Rosa Rodríguez-Montañés	[11] [12] [13]
18	Rudger van Veen	[2]
19	Bart Vermeulen	[5]
20	Luis Elvira Villagra	[9]
21	D. M. H. Walker (Duncan M. Hank Walker)	[9]
22	Jing Wang	[9]
23	Paul J. A. M. van de Wiel	[9]
24	Victor Zieren	[1]

Colors in the list of coauthors