François-Fabien Ferhani

2008
2	EE	François-Fabien Ferhani, Nirmal R. Saxena, Edward J. McCluskey, Phil Nigh: How Many Test Patterns are Useless? VTS 2008: 23-28
2004
1	EE	Edward J. McCluskey, Ahmad A. Al-Yamani, Chien-Mo James Li, Chao-Wen Tseng, Erik H. Volkerink, François-Fabien Ferhani, Edward Li, Subhasish Mitra: ELF-Murphy Data on Defects and Test Sets. VTS 2004: 16-22

Coauthor Index

1	Ahmad A. Al-Yamani	[1]
2	Chien-Mo James Li (James Chien-Mo Li)	[1]
3	Edward Li	[1]
4	Edward J. McCluskey	[1] [2]
5	Subhasish Mitra	[1]
6	Phil Nigh	[2]
7	Nirmal R. Saxena	[2]
8	Chao-Wen Tseng	[1]
9	Erik H. Volkerink	[1]